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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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The all-in-one data logger for the entire vehicle networking
PM-200
The PM-200 sets the bar considerably higher on the topic of safeguarding and troubleshooting vehicles. Bus systems such as CAN, CAN-FD, FlexRay™, LIN, MOST150 and Automotive Ethernet are logged at a data speed up of to 120 MB/s. SSD removable media allow for quick evaluation and distribution of the data. Various upgrade options enable configuration for any application. Flexibility, programmability and support from debugging protocols make it possible to meet the high demands of functionality and fleet tests as well as of test runs.
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Software Platform Bundle
The Software Platform Bundle provides the entire NI software portfolio for building any application. Develop applications in multiple environments, including LabVIEW Professional, LabWindows/CVI, and Measurement Studio. Extend the functionality of the LabVIEW development environment with all add-ons to perform code deployment, hardware integration, data analysis, and code validation. Build automated test systems with TestStand and real-time test systems with VeriStand.
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9-Slot 3U PXI Express Chassis with AC - Up to 8GB/s, All Hybrid
PXES-2590
The ADLINK PXES-2590 is a 9-slot PXI Express chassis equipped with advanced features and functions. Compliant with PXI Express and cPCI Express specifications, the PXES-2590 offers one system slot, one system timing slot, and seven hybrid peripheral slots for versatile test and measurement applications requiring enhanced bandwidth. The hybrid-slot design accepts installation of CompactPCI, PXI, CompactPCI Express, and PXI Express modules into any peripheral slots in PXES-2590, maximizing flexibility. The PXES-2590 is built on a four-link PXI express chassis with 8 GB/s system bandwidth, and 2 GB/s slot bandwidth for all peripheral slots.
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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PCIe-6346 , 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device
785813-01
PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technolog...show more -
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USB-6363, 32 AI (16-Bit, 2 MS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device
782257-01
32 AI (16-Bit, 2 MS/s), 4 AO (2.86 MS/s), 48 DIO USB Multifunction I/O Device - The USB‑6363 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6363 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Full test development environment
XJDeveloper
XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recordi...show more -
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Data Acquisition Systems & Instruments
Whatever your application, mobile or stationary, on a test cell or under extreme environmental conditions, HBM has the right measurement data acquisition system for your needs.
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ARINC 429 Interface cPCI Card
RAR-429
The RAR-429 module is a rugged, reliable, full featured, CompactPCI module designed to provide a stand-alone, ARINC 429 interface for avionics applications. Up to 16 ARINC429 channels are supported on a 3U CompactPCI module. The RAR-429 offers full functional test, simulation, and monitoring for ARINC 429 test and simulation applications.
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PXIe-1065, 18-Slot (9 PXI Slots, 3 PXIe Slots), Up to 3 GB/s PXI Chassis
779730-01
PXIe, 18-Slot (9 PXI Slots, 3 PXIe Slots), Up to 3 GB/s PXI Chassis—The PXIe‑1065 is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1065 has nine PXI peripheral slots, one PXI Express slot with system timing capabilities, three PXI Express slots, and four hybrid slots that accept both PXI and PXI Express peripheral modules.
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4-Slot USB/LXI Modular Chassis
60-105-001
This 4-slot USB/LXI modular chassis offers a small lightweight form factor, making it ideal for portable, benchtop, and space restrictive applications. The chassis is designed for desk or rack mounting and features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.
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Temperature Sensor
Precision temperature sensors from Stellar Technology are in demand worldwide for a variety of industrial test, measurement and process control applications.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 4.09k Ohm
40-294-023
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 31.5Ω
40-252-110
The 40-252-110 is a programmable resistor module with 2 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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PCIe-6323, PCI Express, 32 AI (16-Bit, 250 kS/s), 4 AO (900 kS/s), 48 DIO Multifunction I/O Device
781045-01
PCI Express, 32 AI (16-Bit, 250 kS/s), 4 AO (900 kS/s), 48 DIO Multifunction I/O Device - The PCIe‑6323 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog...show more -
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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IQ Networks
Teledyne RF & Microwave offers a capable range of high performance IQ Modulators and Image Reject Mixers as well as IQ (Quadraphase) Modulators which can be used on applications from commercial test equipment to space qualified projects. IQM products can be used either as an IQ modulator or IQ demodulator and cover several frequency bands from 1.4 GHz to 18 GHz. Click on the model number to view the available datasheets.
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FET Solid State Switch, 300 kHz to 8 GHz, SPDT
U9397A
The Keysight U9397A solid state switch maximizes your frequency range from 300 kHz up to 8 GHz, offering excellent performance with high isolation, low SWR and fast switching speed. Applications include instrumentation, communications, radar, and many other test systems that require high speed RF and microwave SPDT switching.
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Test Equipment Grade Switches
Multi-Tech Industries also manufacturers a line of quality instrument-grade electromechanical switches for commercial, industrial, military, institutional and OEM applications. Rotary switches (open frame, enclosed frame), thumbwheel, keyreader and other types are available to be integrated into your process controls or test instrumentation. Standard and custom switch designs can be modified to meet specific customer requirements.
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Thermal Vacuum Data Acquisition and Control Software
TVAC 7000
Equipment used in space applications needs to go through stringent environmental tests in order to prove that it can survive the extreme conditions experienced during launch and while in space. Some of the key environmental tests include vibration, thermal vacuum, and electromagnetic compatibility. Thermal vacuum test is crucial to confirm the equipment is able to operate under the space vacuum condition.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 3Ω to 1.51MΩ
40-251-050
The 40-251-050 is a programmable resistor module with 2 channels which can be set between 3Ω and 1.51MΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 3A Power MUX BRIC, 12-Channel, 16-Pole
40-571-204
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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Consulting
Consulting Services by LXinstruments including test process consulting, development of product specifications, pretests and feasibility studies, development of applications and support, examination of test equipment and process capability, and more.
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Inertial Navigation Systems (INS and IMU)
Inertial Navigation Systems (INS and IMU)High accuracy 100Hz GPS and GNSS receivers and Inertial Navigation Systems (IMU - inertial measurement units) with Real-time Kinematics (RTK) correction for the most precise position-based test and measurement applications.
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Powered VME64x Crates
9U VME64x 6021
WIENER VME 6021 crate series is the newest generation of 19" integrated packaging system for VME/VME64x bus systems with 9Ux400mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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Software
TestScript
Would you like to read your LabVIEW panel from Python? Or, automate your LabVIEW manual control screen without the overhead of a complex test executive? TestScript is a free Python/LabVIEW connector from Genuen that is simple to add to your existing LabVIEW application and abstracts complex Python coding, allowing you to easily use Python to control LabVIEW or vice versa.
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Data Distribution Middleware
ADS2 Product Family
The high degree of flexibility of ADS2 is achieved through a clear and straight forward architecture design paired with a highly optimized implementation of its components.- A deterministic publish-subscribe data distribution and scheduling middleware- Adapters for a wide range of client applications and third party tools- HW adapters for a wide range of I/O interfaces- A set of native tools for data visualization and analysis, recording and replay- A comprehensive system health monitor- Human readable system configuration files (structured text)- Scriptable generation of system configuration files- Automatic test execution for high level requirement based test definitions
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Regenerative AC Emulator, 1200 VAC, 65 A, 90 KVA, 3‑Phase
SL1213A
The SL1200A series was designed to handle all your 3-phase AC test needs up to 1200 VAC, from 30 kVA to 630 kVA without the need for a transformer. Two voltage ranges are available: 600 VAC and 1200 VAC. The 600 VAC models are ideal for low voltage inverter test as well as EV and EVSE charging test applications. The 1200 VAC models allow for (HVRT) testing at the IEC LV-AC limit without the need for a large, complex test setup.
